Revision as of 23:36, 14 October 2014 by Rcochran (Talk | contribs)


Questions and Comments for DTFT of a Cosine Signal Sampled Above and Below the Nyquist Frequency

A slecture by ECE student Andrew Pawling



Please post your reviews, comments, and questions below.



  • Review by Jacob Holtman

The work is very concise and easy to follow. In the introduction it might help to put a mathematical explanation of Nyquist, which is mentioned in the second section. Also color would help to distinguish the different sections of the plot and how when T is too small the parts seen between p'iand <span class="texhtml" />pi comes from repetitions and not the initial transform k = 0.


  • Review by Fabian Faes

The overall flow of the slecture is very easy to follow and understand. I thought the graphs and the accompanying explanations were very easy to follow and understand without too much difficulty. from my point of view I cannot think of something for improvement since I find the mathematics easy to understand and clearly explained. Great Job!


  • Review by Botao Chen

Good job! Your demonstrations are easy to follow and your outlines are very clear. Is is a good reviewing material for me because of your use of graph which strongly support the demonstration. I could clear see what is going on when the Nyquist rule is violated and when it is not.

    • Author answer here

  • Review by Yerkebulan Y.

You clearly explained that if CT signal is sampled above  Nyquist rate , there is no aliasing.  And if it is below Nyquist rate there is aliasing, and original signal cannot be properly represented because frequencies do not lie between -pi and pi. 


  • Review by Randall Cochran

The slecture was structured really well and that made it easy to follow and understand. The graphs really help demonstrate the ideas that are being conveyed. The only thing you might want to add, like a previous commenter said, would be to state what Nyquist is.


Back to ECE438, Fall 2014

Alumni Liaison

Ph.D. on Applied Mathematics in Aug 2007. Involved on applications of image super-resolution to electron microscopy

Francisco Blanco-Silva