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  • (cur | prev) 09:07, 31 March 2008โ€Ž Ebernard (Talk)โ€Ž . . (434 bytes) (+434)โ€Ž . . (New page: The measurements which represent the data. The statistical model one uses is crucially dependent on the choice of features. Hence it is useful to consider alternative representations of th...)

Alumni Liaison

Ph.D. on Applied Mathematics in Aug 2007. Involved on applications of image super-resolution to electron microscopy

Francisco Blanco-Silva