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  • (cur | prev) 10:03, 31 March 2008‎ Ebernard (Talk)‎ . . (888 bytes) (+888)‎ . . (New page: Assigning a class to a measurement, or equivalently, identifying the probabilistic source of a measurement. The only statistical model that is needed is the conditional model of the class ...)
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Alumni Liaison

Ph.D. on Applied Mathematics in Aug 2007. Involved on applications of image super-resolution to electron microscopy

Francisco Blanco-Silva